Source-linked AI summary
Experimental discovery of structure-property relationships in ferroelectric materials via active learning
Yongtao Liu, Kyle P. Kelley, Rama K. Vasudevan, Hiroshi Funakubo, Maxim A. Ziatdinov, Sergei V. Kalinin
TL;DR
The paper addresses the challenge of selecting informative spectroscopy locations beyond manual intuition or uniform grids. It develops an active-learning workflow combining image-based machine learning with physics-informed exploration targets, and finds different sampling patterns for on-field and off-field hysteresis loops.
Problem
Spectroscopy locations are often chosen manually from operator intuition or sampled on uniform grids, while identifying the specific problems automated experiments should resolve remains under-addressed.
Source: p. 4Method
The DKL workflow learns relationships between domain images and polarization switching, using physics-informed hysteresis descriptors and their uncertainties to guide automated measurements.
Source: pp. 5, 8, 14Results
On-field and off-field hysteresis-loop guidance produced different exploration paths, with sampled points concentrated near c-/c+ ferroelectric and a/c ferroelastic domain walls, respectively.
Source: pp. 15, 17Takeaways & Limitations
The authors describe the approach as extendable to other scanning-probe modalities, electron microscopy, chemical imaging, and materials-discovery settings.
Source: p. 17Pretraining the DKL network on prior data would require stringent analysis of out-of-distribution drift, including drift from different microscope settings.
Source: p. 17
Abstract
from arXiv · showhide
Emergent functionalities of structural and topological defects in ferroelectric materials underpin an extremely broad spectrum of applications ranging from domain wall electronics to high dielectric and electromechanical responses. Many of these have been discovered and quantified via local scanning probe microscopy methods. However, the search for these functionalities has until now been based by either trial and error or using auxiliary information such as topography or domain wall structure to identify potential objects of interest based on the intuition of operator or preexisting hypotheses, with subsequent manual exploration. Here, we report the development and implementation of a machine learning framework that actively discovers relationships between local domain structure and polarization switching characteristics in ferroelectric materials encoded in the hysteresis loop. The latter and descriptors such as nucleation bias, coercive bias, hysteresis loop area, or more complex functionals of hysteresis loop shape and corresponding uncertainties are used to guide the discovery via automated piezoresponse force microscopy (PFM) and spectroscopy experiments. As such, this approach combines the power of machine learning methods to learn the correlative relationships between high dimensional data, and human-based physics insights encoded in the acquisition function. For ferroelectric, this automated workflow demonstrates that the discovery path and sampling points of on-field and off-field hysteresis loops are largely different, indicating the on-field and off-field hysteresis loops are dominated by different mechanisms. The proposed approach is universal and can be applied to a broad range of modern imaging and spectroscopy methods ranging from other scanning probe microscopy modalities to electron microscopy and chemical imaging.
Data analysis
The DKL analysis uses an MLP feature extractor with three hidden layers and is documented in Jupyter notebooks.
Data analysis
- The DKL feature extractor is a standard MLP with three hidden layers of 1000, 500, and 50 neurons.The analysis notebooks are available online.Source: Data analysis · p. 18
PTO sample
The PTO film was grown by chemical vapor deposition on a SrRuO3 bottom electrode over a KTaO3 substrate.
PTO sample
- The PTO film was grown by chemical vapor deposition on a SrRuO3 bottom electrode on a KTaO3 substrate.Source: PTO sample · p. 18
BEPFM and BEPS measurements
PFM measurements used an Oxford Instrument Asylum Research Cypher microscope and Budget Sensor probes; band-excitation data were acquired with a National Instruments DAQ system and LabView.
BEPFM and BEPS measurements
- PFM used an Oxford Instrument Asylum Research Cypher microscope with Budget Sensor Multi75E-G Cr/Pt-coated AFM probes of approximately 3 N/m.Source: BEPFM and BEPS measurements · p. 18
- Band-excitation data were acquired with a National Instruments DAQ card and chassis operated using a LabView framework.Source: BEPFM and BEPS measurements · p. 18
DKL-PFM implementation
A DKL deployment notebook for BEPS measurement is available and can be adapted for other modalities.
DKL-PFM implementation
- The DKL deployment notebook for BEPS measurement is available online and can be adapted for other modalities.Source: DKL-PFM implementation · p. 18
Authors Contribution
S.V.K. conceived the project, and M.Z. realized the DKL-BO workflow. Y.L. analyzed and deployed DKL for PFM measurements; the other listed contributors supported deployment, sample provision, and manuscript discussion.
Authors Contribution
- S.V.K. conceived the project, while M.Z. realized the DKL-BO workflow.Source: Authors Contribution · p. 18
- Y.L. performed detailed analyses and deployed DKL to PFM measurements, obtaining the results.Source: Authors Contribution · p. 18
- R.K.V. and K.K. helped with deployment, H.F. provided the PTO sample, and all authors contributed to discussions and the final manuscript.Source: Authors Contribution · p. 18